Low-k polymer materials integration

Nuclear Reaction Analysis (NRA) for Profiling Light Elements

Electronic Processes in Dielectric Films

Diffusion Studies in Minerals

Integration of advanced optical and electronic devices with Si

Ion beam interactions with semiconductor quantum dots

Defects in Semiconductors

Ion Beam Analysis of the Surface of Volatile Liquids and Solids

Development of Compact Magnetic Spectrometer for High-resolution Ion Beam Analysis.

Archaeometry

Rutherford BackScattering (RBS)

High Resolution RBS (HIRRBS)

Particle Induced X-ray Emission (PIXE)

Nuclear Reaction Analysis (NRA)

X-Ray Fluorescence (XRF)

Ion Implantation

Microbeam

Channeling (PIXE & RBS)

Optical and electrical characterization